Precision Mechanical Systems In Semiconductor Lithography Equipment Design And Development

Authors

  • Aleem Al Razee Tonoy Author
  • Manam Ahmed Author
  • Md Rabbi Khan Author

DOI:

https://doi.org/10.63125/j6tn8727

Keywords:

Precision Mechanical Systems, Semiconductor Lithography, Nanometer-Scale Accuracy, Vibration Control, High-Resolution Patterning

Abstract

The integration of AI and machine learning in precision mechanical systems has significantly transformed semiconductor lithography, enabling higher accuracy, enhanced system reliability, and optimized operational efficiency. This study investigates the impact of AI-driven approaches on predictive maintenance, adaptive error compensation, motion control, metrology accuracy, and thermal management, focusing on their role in improving lithographic performance and process stability. Through a comprehensive review of 50 research papers and 10 industry case studies, this study evaluates how machine learning algorithms enhance predictive maintenance strategies, reducing unplanned downtime by 40%, while adaptive learning models improve motion accuracy by 35%, mitigating thermal drift and stage hysteresis. AI-enhanced motion control strategies have increased production efficiency by 30%, optimizing trajectory planning and resonance damping, whereas AI-powered metrology systems have improved overlay correction by 35% and defect detection by 50%, ensuring higher yield rates and reduced process variability. Additionally, AI-driven thermal modeling and real-time calibration techniques have led to a 40% improvement in system stability, enhancing heat dissipation and mechanical longevity. These findings confirm that AI-enabled precision mechanical systems are critical in advancing next-generation semiconductor lithography, offering higher throughput, improved defect control, and greater process repeatability. The insights gained from this study provide a foundation for future innovations in AI-driven automation, ensuring that semiconductor manufacturing continues to meet the demands of nanometer-scale fabrication with increased efficiency and reliability.

Author Biographies

  • Aleem Al Razee Tonoy

    M.ENG, Mechanial Engineering, Lamar University, Beaumont, TX, USA

  • Manam Ahmed

    Department of Mechanical Engineering, Lamar University, Beaumont, TX, USA

  • Md Rabbi Khan

    Department of Mechanical Engineering, Rowan University, Glassboro, New Jersey, USA

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Published

2025-02-13

How to Cite

Aleem Al Razee Tonoy, Manam Ahmed, & Md Rabbi Khan. (2025). Precision Mechanical Systems In Semiconductor Lithography Equipment Design And Development. American Journal of Advanced Technology and Engineering Solutions, 1(01), 71-97. https://doi.org/10.63125/j6tn8727